{"slug":"ieee-transactions-on-device-and-materials-reliability","name":"IEEE Transactions on Device and Materials Reliability","journalId":"06a500b2-a1bd-7fda-8000-47cff4b15339","groups":[{"manuscriptType":"Letter","categories":[{"category":"LENGTH","label":"Length & word limits","items":[{"key":"abstract_word_limit","value":"250","unit":"words"},{"key":"page_limit","value":"3","unit":"pages"}],"hiddenCount":0},{"category":"CITATION","label":"Citations & references","items":[],"hiddenCount":1},{"category":"OTHER","label":"Formatting & submission","items":[],"hiddenCount":1}]},{"manuscriptType":"Regular Paper","categories":[{"category":"LENGTH","label":"Length & word limits","items":[{"key":"abstract_word_limit","value":"250","unit":"words"},{"key":"page_limit","value":"8","unit":"pages"}],"hiddenCount":0},{"category":"CITATION","label":"Citations & references","items":[],"hiddenCount":1},{"category":"OTHER","label":"Formatting & submission","items":[],"hiddenCount":1}]},{"manuscriptType":"Review Paper","categories":[{"category":"LENGTH","label":"Length & word limits","items":[{"key":"abstract_word_limit","value":"250","unit":"words"},{"key":"page_limit","value":"16","unit":"pages"}],"hiddenCount":0},{"category":"CITATION","label":"Citations & references","items":[],"hiddenCount":1},{"category":"OTHER","label":"Formatting & submission","items":[],"hiddenCount":1}]},{"manuscriptType":"Special Issue Paper","categories":[{"category":"LENGTH","label":"Length & word limits","items":[{"key":"abstract_word_limit","value":"250","unit":"words"},{"key":"page_limit","value":"8","unit":"pages"}],"hiddenCount":0},{"category":"CITATION","label":"Citations & references","items":[],"hiddenCount":1},{"category":"OTHER","label":"Formatting & submission","items":[],"hiddenCount":1}]}]}